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    Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

    New search for: Lindquist, O. P. A.
    New search for: Arwin, H.
    New search for: Forsberg, U.
    New search for: Bergman, J. P.
    New search for: Jarrendahl, K.

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    Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

    New search for: Lindquist, O. P. A.
    New search for: Arwin, H.
    New search for: Forsberg, U.
    New search for: Bergman, J. P.
    New search for: Jarrendahl, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

    New search for: Lindquist, O. P. A.
    New search for: Arwin, H.
    New search for: Forsberg, U.
    New search for: Bergman, J. P.
    New search for: Jarrendahl, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

    Contributors:

    Lindquist, O. P. A. (author) / Arwin, H. (author) / Forsberg, U. (author) / Bergman, J. P. (author) / Jarrendahl, K. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 338/342 ; 575-578

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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