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    Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy

    New search for: Cherns, D.
    New search for: Barnard, J.
    New search for: Mokhtari, H.

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    Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy

    New search for: Cherns, D.
    New search for: Barnard, J.
    New search for: Mokhtari, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy

    New search for: Cherns, D.
    New search for: Barnard, J.
    New search for: Mokhtari, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy

    Contributors:

    Cherns, D. (author) / Barnard, J. (author) / Mokhtari, H. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 66 ; 33 - 38

    Publication date:

    1999-01-01

    Size:

    6 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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