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    Defect production by the TEM beam-the first application of the positron microprobe

    New search for: Mannig, U.
    New search for: Bennewitz, K.
    New search for: Bihr, H.
    New search for: Haaks, M.
    New search for: Sigle, W.
    New search for: Zamponi, C.
    New search for: Maier, K.

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    Defect production by the TEM beam-the first application of the positron microprobe

    New search for: Mannig, U.
    New search for: Bennewitz, K.
    New search for: Bihr, H.
    New search for: Haaks, M.
    New search for: Sigle, W.
    New search for: Zamponi, C.
    New search for: Maier, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defect production by the TEM beam-the first application of the positron microprobe

    New search for: Mannig, U.
    New search for: Bennewitz, K.
    New search for: Bihr, H.
    New search for: Haaks, M.
    New search for: Sigle, W.
    New search for: Zamponi, C.
    New search for: Maier, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Defect production by the TEM beam-the first application of the positron microprobe

    Contributors:

    Mannig, U. (author) / Bennewitz, K. (author) / Bihr, H. (author) / Haaks, M. (author) / Sigle, W. (author) / Zamponi, C. (author) / Maier, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 149 ; 217-220

    Publication date:

    1999-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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