A platform for research: civil engineering, architecture and urbanism
A comparison of preparation methods of copper surfaces for in situ scanning force microscopy investigations
A comparison of preparation methods of copper surfaces for in situ scanning force microscopy investigations
A comparison of preparation methods of copper surfaces for in situ scanning force microscopy investigations
Wadsak, M. (author) / Schreiner, M. (author) / Aastrup, T. (author) / Leygraf, C. (author)
APPLIED SURFACE SCIENCE ; 157 ; 39-46
2000-01-01
8 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Atomic Force Microscopy/Scanning Tunneling Microscopy
TIBKAT | 1994
|Characterization of post-copper CMP surfaces with scanning probe microscopy
British Library Online Contents | 2006
|Atomic and chemical resolution in scanning force microscopy on ionic surfaces
British Library Online Contents | 1999
|British Library Online Contents | 2000
|Atomic Force Microscopy/Scanning Tunneling Microscopy 2
TIBKAT | 1997
|