X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers: Fid-Bau Portal

X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers

Kuhr, T. A. / Vetter, W. M. / Dudley, M. / Skowronski, M.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers

Kuhr, T. A. / Vetter, W. M. / Dudley, M. / Skowronski, M.

X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers

Kuhr, T. A. / Vetter, W. M. / Dudley, M. / Skowronski, M.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers

Contributors:

Kuhr, T. A. (author) / Vetter, W. M. (author) / Dudley, M. (author) / Skowronski, M. (author)

Published in:

MATERIALS SCIENCE FORUM ; 338/342 ; 473-476

Publication date:

2000-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Hassan, J.U. / Bae, H.T. / Lilja, L. et al. | British Library Online Contents | 2014

Characterization of 2 Inch SiC Wafers Made by the Sublimation Method

Sasaki, M. / Shiomi, H. / Nishino, S. | British Library Online Contents | 2001

Anchorage of 0.6 inch Diameter Strands

M. K. Tadros / N. Jongpitaksseel | NTIS | 2003

Microtunneling 36 Inch Diameter Sewers in Northeast Ohio

McCormack, J. C. / Trim, W. / Ericsson, B. et al. | British Library Conference Proceedings | 2007

Sublimation Growth of 50mm Diameter SiC Wafers

Powell, A. R. / Wang, S. / Fechko, G. et al. | British Library Online Contents | 1998