Raman study of strained SiGe layers: Fid-Bau Portal

Raman study of strained SiGe layers

Gu, S. / Zhang, R. / Han, P. / Wang, R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Raman study of strained SiGe layers

Gu, S. / Zhang, R. / Han, P. / Wang, R.

Raman study of strained SiGe layers

Gu, S. / Zhang, R. / Han, P. / Wang, R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Raman study of strained SiGe layers

Contributors:

Gu, S. (author) / Zhang, R. (author) / Han, P. (author) / Wang, R. (author)

Published in:

APPLIED SURFACE SCIENCE ; 81 ; 431

Publication date:

1994-01-01

Size:

431 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

Bollani, M. / Muller, E. / Signoretti, S. et al. | British Library Online Contents | 2003

Observation of defects evolution in strained SiGe layers during strain relaxation

Jang, J. H. / Phen, M. S. / Siebein, K. et al. | British Library Online Contents | 2009

Electrical characterization of low temperature deposited TiO2 films on strained-SiGe layers

Dalapati, G. K. / Chatterjee, S. / Samanta, S. K. et al. | British Library Online Contents | 2003

Raman microprobe analysis of strained polysilicon deposited layers

Talaat, H. / Negm, S. / Schaffer, H. E. et al. | British Library Online Contents | 1998

Characterization of As+ ion-implanted layers in strained-Si/SiGe/Si hetero-structures

Ishida, T. / Irieda, S. / Inada, T. et al. | British Library Online Contents | 2004