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Measurement of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Power Diodes
Measurement of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Power Diodes
Measurement of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Power Diodes
Udal, A. (author) / Velmre, E. (author)
MATERIALS SCIENCE FORUM ; 338/342 ; 781-784
2000-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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