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Investigation of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Diodes

Udal, A. / Velmre, E.

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Investigation of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Diodes

Udal, A. / Velmre, E.

Investigation of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Diodes

Udal, A. / Velmre, E.

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Check availability in my library

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Document information

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Title:

Investigation of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Diodes

Contributors:

Udal, A. (author) / Velmre, E. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I. / Horsfall, A.

Published in:

Silicon Carbide and Related Materials 2006 ; 375-378

MATERIALS SCIENCE FORUM ; 556/557

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Udal, A. / Velmre, E. | British Library Online Contents | 2000

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