X-ray photoelectron and Raman spectroscopy of nanocrystalline Ga0.62In0.38Sb-SiO2 composite films: Fid-Bau Portal

X-ray photoelectron and Raman spectroscopy of nanocrystalline Ga0.62In0.38Sb-SiO2 composite films

Liu, F. M. / Zhang, L. D. / Zheng, M. J. / Li, G. H.

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X-ray photoelectron and Raman spectroscopy of nanocrystalline Ga0.62In0.38Sb-SiO2 composite films

Liu, F. M. / Zhang, L. D. / Zheng, M. J. / Li, G. H.

X-ray photoelectron and Raman spectroscopy of nanocrystalline Ga0.62In0.38Sb-SiO2 composite films

Liu, F. M. / Zhang, L. D. / Zheng, M. J. / Li, G. H.

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Check availability in my library

Order at Subito €

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Document information

Title:

X-ray photoelectron and Raman spectroscopy of nanocrystalline Ga0.62In0.38Sb-SiO2 composite films

Contributors:

Liu, F. M. (author) / Zhang, L. D. (author) / Zheng, M. J. (author) / Li, G. H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 158 ; 281-286

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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