Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Characterization of deep impurities in semiconductors by terahertz tunneling ionization

    New search for: Ganichev, S. D.
    New search for: Ziemann, E.
    New search for: Yassievich, I. N.
    New search for: Perel, V. I.
    New search for: Prettl, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Characterization of deep impurities in semiconductors by terahertz tunneling ionization

    New search for: Ganichev, S. D.
    New search for: Ziemann, E.
    New search for: Yassievich, I. N.
    New search for: Perel, V. I.
    New search for: Prettl, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of deep impurities in semiconductors by terahertz tunneling ionization

    New search for: Ganichev, S. D.
    New search for: Ziemann, E.
    New search for: Yassievich, I. N.
    New search for: Perel, V. I.
    New search for: Prettl, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of deep impurities in semiconductors by terahertz tunneling ionization

    Contributors:

    Ganichev, S. D. (author) / Ziemann, E. (author) / Yassievich, I. N. (author) / Perel, V. I. (author) / Prettl, W. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 281-284

    Publication date:

    2001-01-01

    Size:

    4 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Tunneling Microscopy of Semiconductors

    S. K. Theiss | NTIS | 1993

    Injection level lifetime spectroscopy of impurities in semiconductors

    Ahrenkiel, R. K. / Keyes, B. M. / Johnston, S. | British Library Online Contents | 2000

    The Theory of Rare-Earth Impurities in Semiconductors

    Delerue, C. / Lannoo, M. | British Library Online Contents | 1994

    Room Temperature Terahertz Emission via Intracenter Transition in Semiconductors

    Dezaki, H. / Jing, M.L. / Balasekaran, S. et al. | British Library Online Contents | 2012

    Effect of Stress on Interband Tunneling in Semiconductors

    H. Fritzsche | NTIS | 1969

    Back to top