Intrinsic microcrystalline silicon by postgrowth anneals

Yoon, J.-H. | British Library Online Contents | 2001

The use of electron back-scattered diffraction to study the regrowth of amorphised silicon-based heterostructures

Vernon-Parry, K. D. / Abd-El-Rahman, K. F. / Brough, I. et al. | British Library Online Contents | 2001

Behavior of Native Defects in Semi-Insulating 4H-SiC after High Temperature Anneals and Different Cool-Down Rates

Garces, N.Y. / Glaser, E.R. / Carlos, W.E. et al. | British Library Online Contents | 2009

Magnetic susceptibility of P+N junctions in correlation with the nature of silicon substrate: crystalline or pre-amorphised

Abdelaoui, M. / Idrissi-Benzohra, M. / Joubert, E. et al. | British Library Online Contents | 2003

Advanced activation trends for boron and arsenic by combinations of single, multiple flash anneals and spike rapid thermal annealing

Lerch, W. / Paul, S. / Niess, J. et al. | British Library Online Contents | 2008