Si:Er:O layers grown by molecular beam epitaxy: structural, electrical and optical properties: Fid-Bau Portal

Si:Er:O layers grown by molecular beam epitaxy: structural, electrical and optical properties

Scalese, S. / Franzo, G. / Mirabella, S. / Re, M. / Terrasi, A. / Priolo, F. / Rimini, E. / Carnera, A.

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Si:Er:O layers grown by molecular beam epitaxy: structural, electrical and optical properties

Scalese, S. / Franzo, G. / Mirabella, S. / Re, M. / Terrasi, A. / Priolo, F. / Rimini, E. / Carnera, A.

Si:Er:O layers grown by molecular beam epitaxy: structural, electrical and optical properties

Scalese, S. / Franzo, G. / Mirabella, S. / Re, M. / Terrasi, A. / Priolo, F. / Rimini, E. / Carnera, A.

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Document information

Title:

Si:Er:O layers grown by molecular beam epitaxy: structural, electrical and optical properties

Contributors:

Scalese, S. (author) / Franzo, G. (author) / Mirabella, S. (author) / Re, M. (author) / Terrasi, A. (author) / Priolo, F. (author) / Rimini, E. (author) / Carnera, A. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 81 ; 62 - 66

Publication date:

2001-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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