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Conductimetry and impedance spectroscopy study of low pressure metal organic chemical vapor deposition TiNxOy films as a function of the growth temperature: a percolation approach
Conductimetry and impedance spectroscopy study of low pressure metal organic chemical vapor deposition TiNxOy films as a function of the growth temperature: a percolation approach
Conductimetry and impedance spectroscopy study of low pressure metal organic chemical vapor deposition TiNxOy films as a function of the growth temperature: a percolation approach
Fabreguette, F. (author) / Maglione, M. (author) / Imhoff, L. (author) / Domenichini, B. (author) / Marco de Lucas, M. C. (author) / Sibillot, P. (author) / Bourgeois, S. (author) / Sacilotti, M. (author)
APPLIED SURFACE SCIENCE ; 175-176 ; 574-578
2001-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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