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GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy
GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy
GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy
Hu, Y. F. (author) / Shan, Y. Y. (author) / Beling, C. D. (author) / Fung, S. (author) / Xie, M. H. (author) / Cheung, S. H. (author) / Tu, J. (author) / Brauer, G. (author) / Anwand, W. (author) / Tong, D. S. Y. (author)
MATERIALS SCIENCE FORUM ; 363/365 ; 478-480
2001-01-01
3 pages
Article (Journal)
English
DDC:
620.11
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