GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy

Hu, Y. F. / Shan, Y. Y. / Beling, C. D. et al. | British Library Online Contents | 2001

Nonlinear Optical Materials Studied by Positron Annihilation Spectroscopy

Huang, C.-M. / Sandreczki, T. C. / Jean, Y. C. | British Library Online Contents | 1997

Positron Depth-Profiling of Polymer Interfaces

Gidley, D. W. / DeMaggio, G. B. / Frieze, W. E. et al. | British Library Online Contents | 1997

Defects in TiO2 films on p^+-Si studied by positron annihilation spectroscopy

Coleman, P. G. / Edwardson, C. J. / Zhang, A. et al. | British Library Online Contents | 2012

Depth profiled porosity and microstructure evolution studied by positron annihilation and Raman spectroscopy in SiOCH low-k films

Macchi, C. / Mariotto, G. / Karwasz, G. P. et al. | British Library Online Contents | 2004