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Defect Characterisation of PECVD-Grown Diamond

Britton, D. T. / Hempel, A. / Hempel, M. / Harting, M. / Bauer-Kugelmann, W. / Triftshauser, W.

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Defect Characterisation of PECVD-Grown Diamond

Britton, D. T. / Hempel, A. / Hempel, M. / Harting, M. / Bauer-Kugelmann, W. / Triftshauser, W.

Defect Characterisation of PECVD-Grown Diamond

Britton, D. T. / Hempel, A. / Hempel, M. / Harting, M. / Bauer-Kugelmann, W. / Triftshauser, W.

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Document information

Title:

Defect Characterisation of PECVD-Grown Diamond

Contributors:

Britton, D. T. (author) / Hempel, A. (author) / Hempel, M. (author) / Harting, M. (author) / Bauer-Kugelmann, W. (author) / Triftshauser, W. (author)

Published in:

MATERIALS SCIENCE FORUM ; 363/365 ; 511-513

Publication date:

2001-01-01

Size:

3 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Yang, W. J. / Choa, Y. H. / Sekino, T. et al. | British Library Online Contents | 2003

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Choi, Y. / Lee, H. W. / Song, J. S. et al. | British Library Online Contents | 1996

Positron beam characterisation of a CVD-grown diamond thick film

Harting, M. / Hempel, M. / Britton, D.T. | British Library Online Contents | 1999

Electron-beam-induced current imaging for the characterisation of structural defects in Si1-xGex films grown by LE-PECVD

Virtuani, A. / Marchionna, S. / Acciarri, M. et al. | British Library Online Contents | 2006