A platform for research: civil engineering, architecture and urbanism
The dependence of the etching property of CoSi2 films in diluted HF solutions on the formation conditions
The dependence of the etching property of CoSi2 films in diluted HF solutions on the formation conditions
The dependence of the etching property of CoSi2 films in diluted HF solutions on the formation conditions
Zhu, S. (author) / Ru, G. (author) / Detavernier, C. (author) / Van Meirhaeghe, R. L. (author) / Cardon, F. (author) / Li, B. (author)
APPLIED SURFACE SCIENCE ; 178 ; 44-49
2001-01-01
6 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Effect of zirconium addition on formation of CoSi2 thin films
British Library Online Contents | 2005
|Growth and characterization of CoSi2 films on Si (100) substrates
British Library Online Contents | 2001
|Effect of annealing on CoSi2 thin films prepared by magnetron sputtering
British Library Online Contents | 2005
|British Library Online Contents | 2004
|Effect of sputtering input powers on CoSi2 thin films prepared by magnetron sputtering
British Library Online Contents | 2005
|