A platform for research: civil engineering, architecture and urbanism
Processing, microstructure and properties of chemical vapor deposited TiN/AlN films
Processing, microstructure and properties of chemical vapor deposited TiN/AlN films
Processing, microstructure and properties of chemical vapor deposited TiN/AlN films
Yoshikawa, N. (author) / Aoki, M. (author) / Kikuchi, A. (author) / Taniguchi, S. (author)
INTERNATIONAL JOURNAL OF MATERIALS AND PRODUCT TECHNOLOGY ; 16 ; 109-116
2001-01-01
8 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Processing, microstructure and properties of chemical vapour deposited TiN/AIN films
British Library Online Contents | 2001
|Controlling the microstructure of vapor-deposited pentaerythritol tetranitrate films
British Library Online Contents | 2011
|Chemical vapor deposited RuOx films: interfacial adhesion study
British Library Online Contents | 2003
|British Library Online Contents | 2011
|British Library Online Contents | 2000
|