Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Transmission electron microscopy study of Ge implanted into SiC

    New search for: Gorelik, T.
    New search for: Kaiser, U.
    New search for: Schubert, C.
    New search for: Wesch, W.
    New search for: Glatzel, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Transmission electron microscopy study of Ge implanted into SiC

    New search for: Gorelik, T.
    New search for: Kaiser, U.
    New search for: Schubert, C.
    New search for: Wesch, W.
    New search for: Glatzel, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Transmission electron microscopy study of Ge implanted into SiC

    New search for: Gorelik, T.
    New search for: Kaiser, U.
    New search for: Schubert, C.
    New search for: Wesch, W.
    New search for: Glatzel, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Transmission electron microscopy study of Ge implanted into SiC

    Contributors:

    Gorelik, T. (author) / Kaiser, U. (author) / Schubert, C. (author) / Wesch, W. (author) / Glatzel, U. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 479-486

    Publication date:

    2002-01-01

    Size:

    8 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Transmission Electron Microscopy Investigation of Defects in B-Implanted 6H-SiC

    Persson, P. O. A. / Wahab, Q. / Hultman, L. et al. | British Library Online Contents | 1998

    Transmission electron microscopy investigation into the recrystallization of carbon resulting from laser processing of carbon-implanted copper

    Zdunek, K. | British Library Online Contents | 1995

    Characterisation of implanted surface layers in ion-thinned semiconductors by transmission electron microscopy

    Jacob, D. / Lefebvre, A. | British Library Online Contents | 2003

    Transmission electron microscopy of martensitic transformation in Xe-implanted austenitic 304 stainless steel

    Xie, G. / Song, M. / Mitsuishi, K. et al. | British Library Online Contents | 2005

    Transmission electron microscopy and high-resolution electron microscopy studies of structural defects induced in Si single crystals implanted by helium ions at 600 °C

    Han, W.T. / Liu, H.P. / Li, B.S. | British Library Online Contents | 2018

    Back to top