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Transmission Electron Microscopy Investigation of Defects in B-Implanted 6H-SiC
Transmission Electron Microscopy Investigation of Defects in B-Implanted 6H-SiC
Transmission Electron Microscopy Investigation of Defects in B-Implanted 6H-SiC
Persson, P. O. A. (author) / Wahab, Q. (author) / Hultman, L. (author) / Nordell, N. (author) / Schoener, A. (author) / Rottner, K. (author) / Olsson, E. (author) / Linnarsson, M. K. (author) / Pensl, G. / Morkoc, H.
1998-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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