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    Detection of indium segregation effects in InGaAs/GaAs quantum wells using reflectance-difference spectrometry

    New search for: Ye, X.
    New search for: Chen, Y. H.
    New search for: Xu, B.
    New search for: Wang, Z. G.

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    Detection of indium segregation effects in InGaAs/GaAs quantum wells using reflectance-difference spectrometry

    New search for: Ye, X.
    New search for: Chen, Y. H.
    New search for: Xu, B.
    New search for: Wang, Z. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Detection of indium segregation effects in InGaAs/GaAs quantum wells using reflectance-difference spectrometry

    New search for: Ye, X.
    New search for: Chen, Y. H.
    New search for: Xu, B.
    New search for: Wang, Z. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Detection of indium segregation effects in InGaAs/GaAs quantum wells using reflectance-difference spectrometry

    Contributors:

    Ye, X. (author) / Chen, Y. H. (author) / Xu, B. (author) / Wang, Z. G. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 62 - 65

    Publication date:

    2002-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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