LBIC measurement optimization to detect laser annealing induced defects in Si

Larmande, Y. / Vervisch, V. / Delaporte, P. et al. | British Library Online Contents | 2012

LBIC characterization of LPE Si layers deposited on multicrystalline Si substrates

Stemmer, M. / Wagner, G. / Martinuzzi, S. | British Library Online Contents | 1996

LBIC investigation of impurity-dislocation interaction in FZ silicon wafers

Perichaud, I. / Simon, J. J. / Martinuzzi, S. | British Library Online Contents | 1996

Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

Domínguez, J. / Mass, J. / Moralejo, B. et al. | British Library Online Contents | 2012

Investigation of the solar cell emitter quality by LBIC-like image techniques

Litvinenko, S. / Ilchenko, L. / Kaminski, A. et al. | British Library Online Contents | 2000