LBIC measurement optimization to detect laser annealing induced defects in Si: Fid-Bau Portal

LBIC measurement optimization to detect laser annealing induced defects in Si

Larmande, Y. / Vervisch, V. / Delaporte, P. / Coustillier, G. / Sarnet, T. / Sentis, M. / Etienne, H. / Torregrosa, F.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

LBIC measurement optimization to detect laser annealing induced defects in Si

Larmande, Y. / Vervisch, V. / Delaporte, P. / Coustillier, G. / Sarnet, T. / Sentis, M. / Etienne, H. / Torregrosa, F.

LBIC measurement optimization to detect laser annealing induced defects in Si

Larmande, Y. / Vervisch, V. / Delaporte, P. / Coustillier, G. / Sarnet, T. / Sentis, M. / Etienne, H. / Torregrosa, F.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

LBIC measurement optimization to detect laser annealing induced defects in Si

Contributors:

Larmande, Y. (author) / Vervisch, V. (author) / Delaporte, P. (author) / Coustillier, G. (author) / Sarnet, T. (author) / Sentis, M. (author) / Etienne, H. (author) / Torregrosa, F. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 177 ; 1628-1632

Publication date:

2012-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Sirotkin, V. / Zaitsev, S. / Yakimov, E. | British Library Online Contents | 2002

LBIC investigation of impurity-dislocation interaction in FZ silicon wafers

Perichaud, I. / Simon, J. J. / Martinuzzi, S. | British Library Online Contents | 1996

LBIC characterization of LPE Si layers deposited on multicrystalline Si substrates

Stemmer, M. / Wagner, G. / Martinuzzi, S. | British Library Online Contents | 1996

Investigation of the solar cell emitter quality by LBIC-like image techniques

Litvinenko, S. / Ilchenko, L. / Kaminski, A. et al. | British Library Online Contents | 2000

Detection of junction failures and other defects in silicon and III-V devices using the LBIC technique in lateral configuration

Acciarri, M. / Binetti, S. / Garavaglia, M. et al. | British Library Online Contents | 1996