High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources: Fid-Bau Portal

High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources

Sun, L. / Zhang, D. H. / Zheng, H. Q. / Yoon, S. F. / Kam, C. H.

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High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources

Sun, L. / Zhang, D. H. / Zheng, H. Q. / Yoon, S. F. / Kam, C. H.

High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources

Sun, L. / Zhang, D. H. / Zheng, H. Q. / Yoon, S. F. / Kam, C. H.

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Check availability in my library

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Document information

Title:

High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources

Contributors:

Sun, L. (author) / Zhang, D. H. (author) / Zheng, H. Q. (author) / Yoon, S. F. (author) / Kam, C. H. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 631-636

Publication date:

2001-01-01

Size:

6 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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