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High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources
High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources
High-resolution X-ray diffraction study of strained InGaAsP/InP multiple quantum well structures grown using all solid sources
Sun, L. (Autor:in) / Zhang, D. H. (Autor:in) / Zheng, H. Q. (Autor:in) / Yoon, S. F. (Autor:in) / Kam, C. H. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 4 ; 631-636
01.01.2001
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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