High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects: Fid-Bau Portal

High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects

Lendenmann, H. / Dahlquist, F. / Bergman, J. P. / Bleichner, H. / Hallin, C.

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High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects

Lendenmann, H. / Dahlquist, F. / Bergman, J. P. / Bleichner, H. / Hallin, C.

High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects

Lendenmann, H. / Dahlquist, F. / Bergman, J. P. / Bleichner, H. / Hallin, C.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

Title:

High-Power SiC Diodes: Characteristics, Reliability and Relation to Material Defects

Contributors:

Lendenmann, H. (author) / Dahlquist, F. (author) / Bergman, J. P. (author) / Bleichner, H. (author) / Hallin, C. (author)

Published in:

MATERIALS SCIENCE FORUM ; 389/393 ; 1259-1264

Publication date:

2002-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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