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Photon Emission Analysis of Defect-Free 4H-SiC pn Diodes in Avalanche Regime
Photon Emission Analysis of Defect-Free 4H-SiC pn Diodes in Avalanche Regime
Photon Emission Analysis of Defect-Free 4H-SiC pn Diodes in Avalanche Regime
Banc, C. (author) / Bano, E. (author) / Ouisse, T. (author) / Vassilevski, K. (author) / Zekentes, K. (author)
MATERIALS SCIENCE FORUM ; 389/393 ; 1293-1296
2002-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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