Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes: Fid-Bau Portal

Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Stahlbush, R. E. / Fedison, J. B. / Arthur, S. D. / Rowland, L. B. / Kretchmer, J. W. / Wang, S.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Stahlbush, R. E. / Fedison, J. B. / Arthur, S. D. / Rowland, L. B. / Kretchmer, J. W. / Wang, S.

Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Stahlbush, R. E. / Fedison, J. B. / Arthur, S. D. / Rowland, L. B. / Kretchmer, J. W. / Wang, S.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Contributors:

Stahlbush, R. E. (author) / Fedison, J. B. (author) / Arthur, S. D. (author) / Rowland, L. B. (author) / Kretchmer, J. W. (author) / Wang, S. (author)

Published in:

MATERIALS SCIENCE FORUM ; 389/393 ; 427-430

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Liu, J. Q. / Skowronski, M. / Hallin, C. et al. | British Library Online Contents | 2002

Properties of Different Stacking Faults that Cause Degradation in SiC PiN Diodes

Jacobson, H. / Bergman, J. P. / Hallin, C. et al. | British Library Online Contents | 2003

Propagation of Stacking Faults in 3C-SiC

Nagasawa, H. / Kawahara, T. / Yagi, K. et al. | British Library Online Contents | 2011

The Influence of In-Grown Stacking Faults on the Reverse Current-Voltage Characteristics of 4H-SiC Schottky Barrier Diodes

Harada, S. / Namikawa, Y. | British Library Online Contents | 2007

Partial Dislocations and Stacking Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Fatemi, M. et al. | British Library Online Contents | 2004