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Electronic Localization around Stacking Faults in Silicon Carbide
Electronic Localization around Stacking Faults in Silicon Carbide
Electronic Localization around Stacking Faults in Silicon Carbide
Iwata, H. (Autor:in) / Lindefelt, U. (Autor:in) / Oberg, S. (Autor:in) / Briddon, P. R. (Autor:in)
MATERIALS SCIENCE FORUM ; 389/393 ; 529-532
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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