Characterization of Ni-implanted GaN and SiC: Fid-Bau Portal

Characterization of Ni-implanted GaN and SiC

Pearton, S. J. / Theodoropoulou, N. / Overberg, M. E. / Abernathy, C. R. / Hebard, A. F. / Chu, S. N. / Wilson, R. G. / Zavada, J. M.

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Characterization of Ni-implanted GaN and SiC

Pearton, S. J. / Theodoropoulou, N. / Overberg, M. E. / Abernathy, C. R. / Hebard, A. F. / Chu, S. N. / Wilson, R. G. / Zavada, J. M.

Characterization of Ni-implanted GaN and SiC

Pearton, S. J. / Theodoropoulou, N. / Overberg, M. E. / Abernathy, C. R. / Hebard, A. F. / Chu, S. N. / Wilson, R. G. / Zavada, J. M.

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Title:

Characterization of Ni-implanted GaN and SiC

Contributors:

Pearton, S. J. (author) / Theodoropoulou, N. (author) / Overberg, M. E. (author) / Abernathy, C. R. (author) / Hebard, A. F. (author) / Chu, S. N. (author) / Wilson, R. G. (author) / Zavada, J. M. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 94 ; 159 - 163

Publication date:

2002-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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