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    Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

    New search for: Sahoo, N. K.
    New search for: Tokas, R. B.
    New search for: Thakur, S.

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    Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

    New search for: Sahoo, N. K.
    New search for: Tokas, R. B.
    New search for: Thakur, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

    New search for: Sahoo, N. K.
    New search for: Tokas, R. B.
    New search for: Thakur, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique

    Contributors:

    Sahoo, N. K. (author) / Tokas, R. B. (author) / Thakur, S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 253 ; 1787-1795

    Publication date:

    2006-01-01

    Size:

    9 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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