HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals: Fid-Bau Portal

HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals

Tanaka, M. / Higashida, K. / Kishikawa, T. / Morikawa, T.

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HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals

Tanaka, M. / Higashida, K. / Kishikawa, T. / Morikawa, T.

HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals

Tanaka, M. / Higashida, K. / Kishikawa, T. / Morikawa, T.

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Document information

Title:

HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals

Contributors:

Tanaka, M. (author) / Higashida, K. (author) / Kishikawa, T. (author) / Morikawa, T. (author)

Published in:

MATERIALS TRANSACTIONS ; 43 ; 2169-2172

Publication date:

2002-01-01

Size:

4 pages

ISSN:

1345-9678

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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