Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    HVEM observation of crack tip dislocations in silicon crystals

    New search for: Higashida, K.
    New search for: Kawamura, T.
    New search for: Morikawa, T.
    New search for: Miura, Y.
    New search for: Narita, N.
    New search for: Onodera, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    HVEM observation of crack tip dislocations in silicon crystals

    New search for: Higashida, K.
    New search for: Kawamura, T.
    New search for: Morikawa, T.
    New search for: Miura, Y.
    New search for: Narita, N.
    New search for: Onodera, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    HVEM observation of crack tip dislocations in silicon crystals

    New search for: Higashida, K.
    New search for: Kawamura, T.
    New search for: Morikawa, T.
    New search for: Miura, Y.
    New search for: Narita, N.
    New search for: Onodera, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    HVEM observation of crack tip dislocations in silicon crystals

    Contributors:

    Higashida, K. (author) / Kawamura, T. (author) / Morikawa, T. (author) / Miura, Y. (author) / Narita, N. (author) / Onodera, R. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A -LAUSANNE- ; 319-321 ; 683 - 686

    Publication date:

    2001-01-01

    Size:

    4 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    HVEM Study of Crack Tip Dislocations in Silicon Crystals

    Higashida, K. / Tanaka, M. / Onodera, R. | British Library Online Contents | 2005

    High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals

    Tanaka, M. / Higashida, K. | British Library Online Contents | 2005

    HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals

    Tanaka, M. / Higashida, K. / Kishikawa, T. et al. | British Library Online Contents | 2002

    HVEM observations of dislocation structures near a crack tip in MgO crystals

    Higashida, K. / Narita, N. / Onodera, R. et al. | British Library Online Contents | 1997

    The Early Stage of Dislocation Process around a Crack Tip Observed by HVEM-Tomography in Silicon Single Crystals

    Tanaka, M. / Sadamatsu, S. / Nakamura, H. et al. | British Library Online Contents | 2011

    Back to top