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    HVEM Study of Crack Tip Dislocations in Silicon Crystals

    New search for: Higashida, K.
    New search for: Tanaka, M.
    New search for: Onodera, R.

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    HVEM Study of Crack Tip Dislocations in Silicon Crystals

    New search for: Higashida, K.
    New search for: Tanaka, M.
    New search for: Onodera, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    HVEM Study of Crack Tip Dislocations in Silicon Crystals

    New search for: Higashida, K.
    New search for: Tanaka, M.
    New search for: Onodera, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    HVEM Study of Crack Tip Dislocations in Silicon Crystals

    Contributors:

    Higashida, K. (author) / Tanaka, M. (author) / Onodera, R. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 475/479 ; 4043-4046

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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