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TOF-SIMS characterization of industrial materials: from silicon wafer to polymer

Karen, A. / Man, N. / Shibamori, T. / Takahashi, K.

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TOF-SIMS characterization of industrial materials: from silicon wafer to polymer

Karen, A. / Man, N. / Shibamori, T. / Takahashi, K.

TOF-SIMS characterization of industrial materials: from silicon wafer to polymer

Karen, A. / Man, N. / Shibamori, T. / Takahashi, K.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

TOF-SIMS characterization of industrial materials: from silicon wafer to polymer

Contributors:

Karen, A. (author) / Man, N. (author) / Shibamori, T. (author) / Takahashi, K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 541-546

Publication date:

2003-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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