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    Evaluation of creep behavior of near-eutectic Sn-Ag solders containing small amount of alloy additions

    New search for: Guo, F.
    New search for: Choi, S.
    New search for: Subramanian, K. N.
    New search for: Bieler, T. R.
    New search for: Lucas, J. P.
    New search for: Achari, A.
    New search for: Paruchuri, M.

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    Evaluation of creep behavior of near-eutectic Sn-Ag solders containing small amount of alloy additions

    New search for: Guo, F.
    New search for: Choi, S.
    New search for: Subramanian, K. N.
    New search for: Bieler, T. R.
    New search for: Lucas, J. P.
    New search for: Achari, A.
    New search for: Paruchuri, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evaluation of creep behavior of near-eutectic Sn-Ag solders containing small amount of alloy additions

    New search for: Guo, F.
    New search for: Choi, S.
    New search for: Subramanian, K. N.
    New search for: Bieler, T. R.
    New search for: Lucas, J. P.
    New search for: Achari, A.
    New search for: Paruchuri, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Evaluation of creep behavior of near-eutectic Sn-Ag solders containing small amount of alloy additions

    Contributors:

    Guo, F. (author) / Choi, S. (author) / Subramanian, K. N. (author) / Bieler, T. R. (author) / Lucas, J. P. (author) / Achari, A. (author) / Paruchuri, M. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 351 ; 190-199

    Publication date:

    2003-01-01

    Size:

    10 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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