Chemical and electronic structure of SiO2/Si interfacial transition layer: Fid-Bau Portal

Chemical and electronic structure of SiO2/Si interfacial transition layer

Hattori, T. / Takahashi, K. / Seman, M. B. / Nohira, H. / Hirose, K. / Kamakura, N. / Takata, Y. / Shin, S. / Kobayashi, K.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Chemical and electronic structure of SiO2/Si interfacial transition layer

Hattori, T. / Takahashi, K. / Seman, M. B. / Nohira, H. / Hirose, K. / Kamakura, N. / Takata, Y. / Shin, S. / Kobayashi, K.

Chemical and electronic structure of SiO2/Si interfacial transition layer

Hattori, T. / Takahashi, K. / Seman, M. B. / Nohira, H. / Hirose, K. / Kamakura, N. / Takata, Y. / Shin, S. / Kobayashi, K.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Chemical and electronic structure of SiO2/Si interfacial transition layer

Contributors:

Hattori, T. (author) / Takahashi, K. (author) / Seman, M. B. (author) / Nohira, H. (author) / Hirose, K. (author) / Kamakura, N. (author) / Takata, Y. (author) / Shin, S. (author) / Kobayashi, K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 212-213 ; 547-555

Publication date:

2003-01-01

Size:

9 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Nohira, H. / Shiraishi, T. / Nakamura, T. et al. | British Library Online Contents | 2003

Atomic-scale depth profiling of composition, chemical structure and electronic band structure of La2O3/Si(100) interfacial transition layer

Nohira, H. / Shiraishi, T. / Takahashi, K. et al. | British Library Online Contents | 2004

Suppression of interfacial diffusion by a predeposited Hf metal layer on SiO2/Si

Tan, R. / Azuma, Y. / Kojima, I. | British Library Online Contents | 2004

Interfacial enhancement of nano-SiO2/polypropylene composites

Chen, J. H. / Rong, M. Z. / Ruan, W. H. et al. | British Library Online Contents | 2009

Compositional transition layer in SiO2/Si interface observed by high-resolution RBS

Kimura, K. / Nakajima, K. | British Library Online Contents | 2003