Depth Dependence of Defects in Ion-Implanted Si Probed by a Positron Beam

Fujinami, M. / Miyagoe, T. / Sawada, T. et al. | British Library Online Contents | 2004

Depth profiling of defects in nitrogen implanted silicon using a slow positron beam

Taylor, J.W. / Saleh, A.S. / Rice-Evans, P.C. et al. | British Library Online Contents | 1999

Positron Annihilation Studies of Defects in Ion Implanted Palladium

Abe, H. / Uedono, A. / Uchida, H. et al. | British Library Online Contents | 2001

Characterisation of Al^+-implanted LiF by a monoenergetic positron beam

Sendezera, E.J. / Davidson, A.T. / Fischer, C.G. et al. | British Library Online Contents | 1999

Positron Beam Studies of Defects in Semiconductors

Krause-Rehberg, R. / Borner, F. / Redmann, F. | British Library Online Contents | 2001