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    Advanced study of various characteristics found in RHEED patterns during the growth of InAs quantum dots on GaAs (0 0 1) substrate by molecular beam epitaxy

    New search for: Lee, J. W.
    New search for: Schuh, D.
    New search for: Bichler, M.
    New search for: Abstreiter, G.

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    Advanced study of various characteristics found in RHEED patterns during the growth of InAs quantum dots on GaAs (0 0 1) substrate by molecular beam epitaxy

    New search for: Lee, J. W.
    New search for: Schuh, D.
    New search for: Bichler, M.
    New search for: Abstreiter, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Advanced study of various characteristics found in RHEED patterns during the growth of InAs quantum dots on GaAs (0 0 1) substrate by molecular beam epitaxy

    New search for: Lee, J. W.
    New search for: Schuh, D.
    New search for: Bichler, M.
    New search for: Abstreiter, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Advanced study of various characteristics found in RHEED patterns during the growth of InAs quantum dots on GaAs (0 0 1) substrate by molecular beam epitaxy

    Contributors:

    Lee, J. W. (author) / Schuh, D. (author) / Bichler, M. (author) / Abstreiter, G. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 228 ; 306-312

    Publication date:

    2004-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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