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Characterizations of SiC/SiO~2 Interface Quality Towards High Power MOSFETs Realization
Characterizations of SiC/SiO~2 Interface Quality Towards High Power MOSFETs Realization
Characterizations of SiC/SiO~2 Interface Quality Towards High Power MOSFETs Realization
Ziane, D. (author) / Bluet, J. M. (author) / Guillot, G. (author) / Godignon, P. (author) / Monserrat, J. (author) / Ciechonski, R. (author) / Syvajarvi, M. (author) / Yakimova, R. (author) / Chen, L. (author) / Mawby, P. (author)
MATERIALS SCIENCE FORUM ; 457/460 ; 1281-1286
2004-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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