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Benefits of High-k Dielectrics in 4H-SiC Trench MOSFETs
Benefits of High-k Dielectrics in 4H-SiC Trench MOSFETs
Benefits of High-k Dielectrics in 4H-SiC Trench MOSFETs
Wright, N. G. (author) / Poolamai, N. (author) / Vassilevski, K. V. (author) / Horsfall, A. B. (author) / Johnson, C. M. (author)
MATERIALS SCIENCE FORUM ; 457/460 ; 1433-1436
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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