Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers: Fid-Bau Portal

Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers

Le Donne, A. / Binetti, S. / Acciarri, M. / Castaldini, A. / Nava, F. / Cavallini, A. / Pizzini, S.

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Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers

Le Donne, A. / Binetti, S. / Acciarri, M. / Castaldini, A. / Nava, F. / Cavallini, A. / Pizzini, S.

Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers

Le Donne, A. / Binetti, S. / Acciarri, M. / Castaldini, A. / Nava, F. / Cavallini, A. / Pizzini, S.

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Title:

Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers

Contributors:

Le Donne, A. (author) / Binetti, S. (author) / Acciarri, M. (author) / Castaldini, A. (author) / Nava, F. (author) / Cavallini, A. (author) / Pizzini, S. (author)

Published in:

MATERIALS SCIENCE FORUM ; 457/460 ; 1503-1506

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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