Contactless Electrical Defect Characterization and Topography of a-Plane Grown Epitaxial Layers

Wagner, M. / Mustafa, E. / Hahn, S. et al. | British Library Online Contents | 2007

Structural and electrical characterization of epitaxial 4H-SiC layers for power electronic device applications

Scaltrito, L. / Porro, S. / Cocuzza, M. et al. | British Library Online Contents | 2003

Electrical characterization of Schottky diodes fabricated on SiC epitaxial layers grown on porous SiC substrates

Kuznetsov, N. I. / Mynbaeva, M. G. / Melnychuk, G. et al. | British Library Online Contents | 2001

Electrical Characterization of High-Voltage 4H-SiC Diodes on High-Temperature CVD-Grown Epitaxial Layers

Zimmermann, U. / Osterman, J. / Zhang, J. et al. | British Library Online Contents | 2002

Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers

Le Donne, A. / Binetti, S. / Acciarri, M. et al. | British Library Online Contents | 2004