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Defects in He^+ Irradiated 6H-SiC Probed by DLTS and LTPL Measurements
Defects in He^+ Irradiated 6H-SiC Probed by DLTS and LTPL Measurements
Defects in He^+ Irradiated 6H-SiC Probed by DLTS and LTPL Measurements
Ruggiero, A. (author) / Libertino, S. (author) / Mauceri, M. (author) / Reitano, R. (author) / Musumeci, P. (author) / Roccaforte, F. (author) / La Via, F. (author) / Calcagno, L. (author)
MATERIALS SCIENCE FORUM ; 457/460 ; 493-496
2004-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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