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Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films
Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films
Quantitative time-of-flight secondary ion mass spectrometry for the characterization of multicomponent adsorbed protein films
Wagner, M. S. (author) / Shen, M. (author) / Horbett, T. A. (author) / Castner, D. G. (author)
APPLIED SURFACE SCIENCE ; 203-204 ; 704-709
2003-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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