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Analysis of surfactants adsorbed on cement using secondary ion mass spectrometry (SIMS)
AbstractThe SIMS-technique permits both the qualitative and the quantitative analysis of surfactants adsorbed on cement or its hydration products. The principles of such an analysis are discussed and some typical results are presented.
RésuméMit SIMS können an Zement adsorbierte Tenside qualitativ und quantitativ bestimmt werden. Die Grundlagen einer solchen Analyse und einige typische Ergebnisse werden vorgestellt.
Analysis of surfactants adsorbed on cement using secondary ion mass spectrometry (SIMS)
AbstractThe SIMS-technique permits both the qualitative and the quantitative analysis of surfactants adsorbed on cement or its hydration products. The principles of such an analysis are discussed and some typical results are presented.
RésuméMit SIMS können an Zement adsorbierte Tenside qualitativ und quantitativ bestimmt werden. Die Grundlagen einer solchen Analyse und einige typische Ergebnisse werden vorgestellt.
Analysis of surfactants adsorbed on cement using secondary ion mass spectrometry (SIMS)
Nägele, E. (author) / Schneider, U. (author)
Cement and Concrete Research ; 15 ; 1022-1026
1985-08-08
5 pages
Article (Journal)
Electronic Resource
English
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