Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM: Fid-Bau Portal

Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM

Kamezawa, C. / Hirai, M. / Kusaka, M. / Iwami, M. / Labis, J.

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Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM

Kamezawa, C. / Hirai, M. / Kusaka, M. / Iwami, M. / Labis, J.

Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM

Kamezawa, C. / Hirai, M. / Kusaka, M. / Iwami, M. / Labis, J.

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Check availability in my library

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Document information

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Document information

Title:

Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM

Contributors:

Kamezawa, C. (author) / Hirai, M. (author) / Kusaka, M. (author) / Iwami, M. (author) / Labis, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 237 ; 607-611

Publication date:

2004-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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