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Observation of dislocations in strain-relaxed silicon-germanium thin films with flat surfaces grown on ion-implanted silicon substrates
Observation of dislocations in strain-relaxed silicon-germanium thin films with flat surfaces grown on ion-implanted silicon substrates
Observation of dislocations in strain-relaxed silicon-germanium thin films with flat surfaces grown on ion-implanted silicon substrates
Yamanaka, J. (author) / Sawano, K. (author) / Nakagawa, K. (author) / Suzuki, K. (author) / Ozawa, Y. (author) / Koh, S. (author) / Hattori, T. (author) / Shiraki, Y. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 7 ; 389-392
2004-01-01
4 pages
Article (Journal)
English
DDC:
621.38152
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