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Electrical properties of N atomic layer doped Si epitaxial films grown by ultraclean low-pressure chemical vapor deposition
Electrical properties of N atomic layer doped Si epitaxial films grown by ultraclean low-pressure chemical vapor deposition
Electrical properties of N atomic layer doped Si epitaxial films grown by ultraclean low-pressure chemical vapor deposition
Jeong, Y. (author) / Sakuraba, M. (author) / Murota, J. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 8 ; 121-124
2005-01-01
4 pages
Article (Journal)
English
DDC:
621.38152
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