Characterization of 4H-SiC Epitaxial Layers by Microwave Photoconductivity Decay: Fid-Bau Portal

Characterization of 4H-SiC Epitaxial Layers by Microwave Photoconductivity Decay

Kumar, R. J. / Losee, P. A. / Li, C. / Seiler, J. / Bhat, I. B. / Chow, T. P. / Borrego, J. M. / Gutmann, R. J.

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Characterization of 4H-SiC Epitaxial Layers by Microwave Photoconductivity Decay

Kumar, R. J. / Losee, P. A. / Li, C. / Seiler, J. / Bhat, I. B. / Chow, T. P. / Borrego, J. M. / Gutmann, R. J.

Characterization of 4H-SiC Epitaxial Layers by Microwave Photoconductivity Decay

Kumar, R. J. / Losee, P. A. / Li, C. / Seiler, J. / Bhat, I. B. / Chow, T. P. / Borrego, J. M. / Gutmann, R. J.

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Title:

Characterization of 4H-SiC Epitaxial Layers by Microwave Photoconductivity Decay

Contributors:

Kumar, R. J. (author) / Losee, P. A. (author) / Li, C. (author) / Seiler, J. (author) / Bhat, I. B. (author) / Chow, T. P. (author) / Borrego, J. M. (author) / Gutmann, R. J. (author) / Nipoti, R. / Poggi, A.

Published in:

Silicon Carbide and Related Materials 2004 ; 405-408

MATERIALS SCIENCE FORUM ; 483/485

Publication date:

2005-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Ottaviani, L. / Palais, O. / Barakel, D. et al. | British Library Online Contents | 2009

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Microwave photoconductivity techniques for the characterization of semiconductors

Citarella, G. / von Aichberger, S. / Kunst, M. | British Library Online Contents | 2002

Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique

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Persistent Photoconductivity in Structures of Amorphous Layers

Vateva, E. | British Library Online Contents | 1992